Influence of carrier statistics on InGaN quantum dot device performance

نویسندگان

  • N. N. Ledentsov
  • A. F. Ioffe
چکیده

In this work InGaN quantum dots (QDs) in GaN matrix formed during strain induced phase separation were investigated. We show that although electron – photon interaction rate in residual quantum well (QW) InGaN is high, carrier capture to QD levels and carrier escape from QD levels to the QW is slowed presumably due to large energy distance between the QD levels and between the QD levels and the QW band. This leads to deviation of quasiequilibrium of carrier distribution in QDs even at temperature higher than 300K. We also modify rate equation model taking into account this deviation. In this model we consider the QW as a quasiequilibrium reservoir, but carrier statistics in the QDs is calculated in term of nonequilibrium statistics of Sah-Noyce-Shokkley-Read centers with strongly inhomogeneous localization depth. This model describes lasing line broadening in terms of carrier burning and formation of multimode emission.

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تاریخ انتشار 2004